ASIC Evaluation Expertise

We are very experienced in evaluating and characterizing analog, mixed-signal ASICs & IP-Modules. We have detailed knowledge of measurement techniques and measurement setups, which are essential to perform low noise, high impedance, signal-to-noise and distortion ratio measurements as well as phase noise and bit-error-rate (BER) measurements of up to 10GHz. Over time we have developed a suite of software tools which perform all required digital signal processing functions to analyze analog-to-digital converters (ADC) and digital-to-analog converts (DAC). The ASIC design engineers, who have detailed knowledge of the design of the device under test (DUT), are involved in all phases of the evaluation and characterization process, to check that the DUT is evaluated at all relevant and critical operation modes. This ensures that the device is fully characterized. We will analyze the results to estimate the yield for specific performance levels. If necessary we will suggest strategies to further improve yield and performance.

Especially during the initial bring-up of first silicon, swift changes on the evaluation setup e.g circuit board design and software is key. This allows the lab engineers to test ideas and easily make changes to the evaluation setup without loosing time characterizing the ASIC.

 

We offer a rapid in-house evaluation-board design service.

We provide analog mixed-signal designs, which enable the evaluation of all required parameters of the ASIC and IP-Modules to be characterized.

 

The in-house rapid PCB prototyping comprises:
  • Schematic capture
  • PCB Layout
  • SMD Assembly
  • Reflow Soldering
  • PCB rework


services2



Schematic Design

pcb schematic

 

PCB Documentation

Layout Implementation

20150901 PCBLayout

In-house PCB Assembly & Reflow

asic_06

asic_05

fpga_board3


In-house Evaluation Software

Time Domain Plots
20150901 inhouse software time
Frequency Domain Plot

20150901 inhouse software FFT

Noise Shaping of a ΣΔ Modulator

20150901 inhouse software FFT2



Device Characterization

Example: Capacitor Mismatch variation over Wafer

20150901 Device Characterisation1

 

Mismatch of a  16fF (4 × 4 µm) Capacitor

20150901 Device Characterisation2